The statistical process control chart developed by Walter Shewhart has proved to be an effective and essential tool for quality improvement in the manufacture of discrete parts. The use of SPC in the process industries has, unfortunately, not been so successful. Typical problems include frequent false alarms due to autocorrelation, and/or control chart insensitivity due to rational subgroups of size one.
This two day seminar will provide you with SPC methods that have been specifically designed to deal with the problems unique to the process industries. These techniques will be demonstrated using SPC/PI+ software with actual industrial data. Upon completion of this seminar you will be able to successfully implement SPC in your process using these principles.
This seminar is designed for managers, process engineers, quality professionals, technicians, and others who are involved in the application of SPC methods in the chemical and process industries. Seminar participants should have an working knowledge of SPC, including X-bar and R charts, and basic statistics.
The 3-day basic SPC seminar is recommended as a pre-requisite.
The seminar textbook is "Introduction to Statistical Quality Control" (2nd edition) by Douglas C. Montgomery. A workbook is included that contains all of the lecture material.