The statistical process control chart
developed by Walter Shewhart has proved to be an
effective and essential tool for quality improvement in the manufacture of
discrete parts. The use of SPC in the process industries has, unfortunately,
not been so successful. Typical problems include frequent false alarms due to
autocorrelation, and/or control chart insensitivity due to rational subgroups
of size one.
This two day seminar will provide you with
SPC methods that have been specifically designed to deal with the problems
unique to the process industries. These techniques will be demonstrated using
SPC/PI+ software with actual industrial data. Upon completion of this seminar
you will be able to successfully implement SPC in your process using these
principles.
This seminar is designed for managers,
process engineers, quality professionals, technicians, and others who are
involved in the application of SPC methods in the chemical and process
industries. Seminar participants should have an
working knowledge of SPC, including X-bar and R charts, and basic statistics.
The 3-day basic SPC seminar is recommended as
a pre-requisite.
The seminar textbook is "Introduction to
Statistical Quality Control" (2nd edition) by Douglas C. Montgomery. A
workbook is included that contains all of the lecture material.
DAY 1:
DAY 2: